Pattern recognition in mental processes: determining vestiges of the subconscious through ultrametric component analysis
Murtagh, Fionn. 2014. 'Pattern recognition in mental processes: determining vestiges of the subconscious through ultrametric component analysis'. In: 2014 IEEE 13th International Conference on Cognitive Informatics and Cognitive Computing. London, United Kingdom 18-20 August 2014. [Conference or Workshop Item]
No full text availableAbstract or Description
We develop a novel consensus of hierarchical clusterings. We do this in order to have a framework (including visualization and supporting interpretation) for the parts of the data that are determined to be ultrametric. Furthermore a major objective is to determine locally ultrametric relationships as opposed to non-local ultrametric relationships. This work aims at a major new application, namely quantifying and interpreting vestiges of the subconscious, or what could be arising from subconscious processes, in narrative, through finding emotional content, metaphor and other potential expressions of the subconscious, i.e. of symmetric logic as defined by the psychoanalyst, Matte Blanco.
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Conference or Workshop Item (Paper) |
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London, United Kingdom |
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Date range: |
18-20 August 2014 |
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Item ID: |
16199 |
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Date Deposited: |
11 Jan 2016 13:11 |
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Last Modified: |
28 Aug 2019 12:04 |
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