Technostress, Career Commitment, Satisfaction with Life, and Work-Family Interaction Among Workers in Information and Communication Technologies
Carlotto, Mary Sandra; Wendt, Guilherme Welter and Jones, Alice P.. 2017. Technostress, Career Commitment, Satisfaction with Life, and Work-Family Interaction Among Workers in Information and Communication Technologies. Actualidades en Psicología, 31(122), ISSN 2215-3535 [Article]
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Abstract or Description
Technostress occurs when individuals experience negative psychosocial effects of technology usage and also demonstrate negative valence associated with ICT use. It is composed of four dimensions (Disbelief, Fatigue, Anxiety, and Ineffectiveness), which describe two aspects of technostress (Technoanxiety and Technofatigue). This study aimed to investigate the relation between technostress dimensions, career commitment, life satisfaction, and work-family interactions among ICT professionals. Variables including gender, age and length of employment were also considered. The sample was composed of 234 Brazilian individuals. It was found that work-family and family-work conflicts were associated with increased technofatigue and tecnoanxiety, and decreased career resilience. Age and gender differences were also identified, which emphasizes the role of organizations and the society in what refers to the scope of this study to reduce inequalities in workplace and to support better preventive actions.
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Article |
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Keywords: |
Technostress, career commitment, life satisfaction, work-family interaction, Information and Communications Technologies |
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Dates: |
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Item ID: |
20530 |
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Date Deposited: |
06 Jun 2017 09:30 |
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Last Modified: |
29 Apr 2020 16:27 |
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Peer Reviewed: |
Yes, this version has been peer-reviewed. |
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